Infinite family of persistence exponents for interface fluctuations
arXiv:cond-mat/0303214 · doi:10.1103/PhysRevLett.91.086103
Abstract
We show experimentally and theoretically that the persistence of large deviations in equilibrium step fluctuations is characterized by an infinite family of independent exponents. These exponents are obtained by carefully analyzing dynamical experimental images of Al/Si(111) and Ag(111) equilibrium steps fluctuating at high (970K) and low (320K) temperatures respectively, and by quantitatively interpreting our observations on the basis of the corresponding coarse-grained discrete and continuum theoretical models for thermal surface step fluctuations under attachment/detachment (``high-temperature'') and edge-diffusion limited kinetics (``low-temperature'') respectively.
LaTeX, 4 pages, 2 figures
Cited by in corpus (4)
- Persistence in nonequilibrium surface growth
- Sampling Time Effects for Persistence and Survival in Step Structural Fluctuations
- Generalized survival in equilibrium step fluctuations
- Mapping spatial persistent large deviations of nonequilibrium surface growth processes onto the temporal persistent large deviations of stochastic random walk processes