Electron Correlation Effects in Resonant Inelastic X-ray Scattering of NaV2O5

Abstract

Element- and site-specific resonant inelastic x-ray scattering spectroscopy (RIXS) is employed to investigate electron correlation effects in {$\mathrm{Na}{\mathrm{V}}_2{\mathrm{O}}_5$}. In contrast to single photon techniques, RIXS at the vanadium $L_3$ edge is able to probe $d-d^{\ast }$ transitions between V d-bands. A sharp energy loss feature is observed at -1.56 eV, which is well reproduced by a model calculation including correlation effects. The calculation identifies the loss feature as excitation between the lower and upper Hubbard bands and permits an accurate determination of the Hubbard interaction term $U=3.0\pm 0.2$ eV.

arXiv comment15 pages, four figures, accepted to Phys. Rev. Lett

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Cited by in corpus (5)

• Resonant Inelastic X-ray Scattering Studies of Elementary Excitations
• Inelastic X-ray scattering in correlated (Mott) insulators
• An angle-resolved soft x-ray spectroscopy study of the electronic states of single crystal MgB2
• Orbital-resolved Soft X-Ray Spectroscopy in NaV2O5
• Inelastic x-ray scattering as a probe of electronic correlations