paper

Cooperative Jahn-Teller transition and resonant x-ray scattering in thin film

arXiv:cond-mat/0110587 · doi:10.1103/PhysRevB.66.020407

Abstract

Epitaxial thin films of stoichiometric were grown on substrates using the pulsed laser deposition technique. From the high resolution x-ray diffraction measurements, the lattice parameters were determined as a function of temperature and the cooperative Jahn-Teller transition was found to occur at =573.0 K. Also measured was resonant x-ray scattering intensity of the orthorhombic (100) peak of near the Mn K edge from low temperatures to above . We demonstrate that the integrated intensity of the (100) peak is proportional to the 3/2 power of the orthorhombic strain at all temperatures, and thus provide an experimental evidence that the resonant scattering near the Mn K edge in is largely due to the Jahn-Teller effect.

13 pages, 4 figures

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