Coherent low-energy charge transport in a diffusive S-N-S junction
arXiv:cond-mat/0107194 · doi:10.1103/PhysRevLett.87.206801
Abstract
We have studied the current voltage characteristics of diffusive mesoscopic Nb-Cu-Nb Josephson junctions with highly-transparent Nb-Cu interfaces. We consider the low-voltage and high-temperature regime eV<ε_{c}<k_{B}T where epsilon_{c} is the Thouless energy. The observed excess current as well as the observed sub-harmonic Shapiro steps under microwave irradiation suggest the occurrence of low-energy coherent Multiple Andreev Reflection (MAR).
4 pages, 4 figures, final version
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