Laboratory Characterization of a Ge-CCD Prototype for Future Near-Infrared Astronomical Instrumentation

Abstract

Germanium charge-coupled devices (Ge-CCDs) extend CCD imaging beyond the silicon cutoff and are candidate detectors for the near-infrared channel of future astronomical instruments, in particular the spectrographs of next-generation wide-field surveys. We report the laboratory characterization at Brookhaven National Laboratory (BNL) of a prototype fabricated at MIT Lincoln Laboratory. We describe the cryogenic test system and readout, and present measurements of the output waveform, dark current, readout noise, and X-ray response. The dark current at 94.69 K is $26.12\pm 0.08$ e${}^{-}$ pixel${}^{-1}$ s${}^{-1}$. Under ${}^{55}$Fe irradiation without on-chip binning, the charge generated by an X-ray is confined within $2\times 2$ pixels, and the Mn K$\alpha$ line has a full width at half maximum (FWHM) of $8.5\pm 0.1$% for single-pixel events. Since the charge generated by X-rays above about 30 keV spreads over $3\times 3$ or more pixels, the CCD was operated with $2\times 2$ on-chip binning at higher energies. This yielded FWHMs of $8.4\pm 0.4$% at 30.9 keV (${}^{133}$Ba, ASCA grades 0, 2, 3, 4, and 6) and $7.45\pm 0.04$% at 59.5 keV (${}^{241}$Am, all grades). These results establish a baseline for the device and for the BNL test system. Measurements of the temperature dependence, optical response, and charge-transfer performance will connect this baseline to the requirements of near-infrared astronomical instruments.