Time-Resolved Thermal Susceptibility Mapping via Low-Temperature Scanning Laser Microscopy

Abstract

We present a multiharmonic lock-in detection approach that utilizes the inverse Fast Fourier Transform to reconstruct the time evolution of thermal susceptibility with high spatial resolution. The method is implemented on a custom-built, modular scanning laser microscope designed for operation in low working-distance optical cryostats and thoroughly calibrated for spatial accuracy. A demonstrative case study using a superconducting resonator highlights the capability of this technique to generate thermal images on time scales significantly shorter than the intrinsic scanning speed, thus enabling dynamic thermal characterization with high spatial fidelity. The proposed technique of low-temperature time-resolved scanning laser microscopy offers unique opportunities to explore superconducting devices, 2D materials, hybrid planar structures, and other low-dimensional systems.