Fast Ptychographic Near-Field Computed Tomography

Abstract

Near-field X-ray ptychography enables quantitative three-dimensional imaging with nanometer-scale resolution, but its broader application is limited by long acquisition times - often necessitating cryogenic or vacuum environments - and demanding sample preparation procedures. In this paper, we present a flexible near-field ptychography setup that operates under ambient conditions and features an adjustable geometry for different sample sizes and resolution requirements. By replacing stepwise angular acquisition with a fly-rotation sample motion, the scanning overhead is reduced by a factor of 11, drastically lowering the tomographic scan time. To address the bottleneck in sample preparation, we also introduce a sample milling machine that enables fast preparation of specimen pillars with diameters down to 20 um. By lowering both preparation effort and measurement time while maintaining high spatial resolution, the presented system overcomes key limitations of near-field ptychography and makes quantitative X-ray nanotomography substantially more accessible for biological research.