paper

Chernoff-Stein-Type Exponent in Testing Between Two Outlier Distributions

arXiv:2608.05933

Abstract

Among length- random sequences, one sequence is an outlier whose index is random. Under hypothesis , the components of the outlier are independent and identically distributed (IID) according to , whereas under hypothesis they are IID according to . The remaining sequences are mutually independent, independent of the outlier, and IID according to under both hypotheses. Based on the observation of all sequences, one wishes to decide between and . Under the constraint that the decision error probability under must be bounded away from , we determine the fastest exponential decay rate of the decision error probability under .

Chernoff-Stein-Type Exponent in Testing Between Two Outlier Distributions · wovepaper