Proof of Concept Measurements of Laterally Graded Multilayers for Soft X-ray Spectropolarimetry
arXiv:2607.27664
The paper presents proof‑of‑concept measurements of laterally graded multilayer mirrors for a soft X‑ray spectropolarimeter, testing Cr‑Sc and W‑B‑C multilayers and demonstrating polarization‑dependent signal modulation.
Abstract
This work describes proof of concept measurements for a soft X-ray spectropolarimeter that utilizes laterally graded multilayer mirrors within a grating spectrometer. The work tests two multilayers: a Chromium-Scandium multilayer designed to be utilized at Brewster's angle in the 200-400 eV range and a Tungsten Boron Carbide mirror designed to reflect X-rays at 30 degrees incidence in the 500-850 eV range. We present measurements of monochromatic, polarized light reflecting off of these multilayers over a range of polarization angles, demonstrating the expected modulation of signal with respect to incident polarization angle