paper

Calibrating the Digital Twin Channel: Statistics-Consistent Sim-to-Lab Adaptation for W-Band Industrial OFDM Links

arXiv:2607.26501

Abstract

Digital twins (DTs) can reduce over-the-air validation cost in industrial wireless networks, but their utility depends on the fidelity of the underlying channel twin (CT). At W-band, site-specific ray tracing captures deterministic propagation geometry, yet its channel frequency responses (CFRs) do not reproduce the small-scale impairments and capture-to-capture variability observed in laboratory orthogonal frequency-division multiplexing (OFDM) measurements above 90 GHz. This paper proposes Statistics-Consistent Sim-to-Lab Adaptation (SC-SLA), a calibration framework that improves the fidelity of a 95 GHz Sionna ray-traced CT toward that of the testbed by aligning the mean power delay profile (PDP), the distribution of root-mean-square delay spread (), and per-subcarrier statistics at 50 MHz sampling bandwidth. SC-SLA uses a generative adversarial network (GAN)-inspired, cycle-consistent architecture with ResNet generators and batch-level channel-statistics losses on the PDP, sub-band PDP, moments and quantiles, and normalized mean-square error (NMSE) of the mean CFR-magnitude profile. The framework is non-adversarial and requires neither paired simulated/measured samples nor discriminators. On held-out 95 GHz data, SC-SLA reduces the Kolmogorov-Smirnov (KS) statistic from 0.86 to 0.050 relative to the impairment-augmented ray-traced input, and by 44% (from 0.089 to 0.050) relative to the strongest of four supervised baselines (FCNN, CNN1D, BiLSTM, and UNet1D). Without retraining, the same checkpoint also generalizes to 92-94 GHz carriers, where it achieves the lowest PDP and CFR-magnitude errors among all baselines while reducing the -distribution mismatch relative to the uncalibrated twin.

Submitted for possible publication to IEEE. Paper currently under review. The contents of this paper may change at any time without notice

Calibrating the Digital Twin Channel: Statistics-Consistent Sim-to-Lab Adaptation for W-Band Industrial OFDM Links · wovepaper