3D scanning microscopy through scattering surfaces using the optical memory effect
arXiv:2607.14751
The paper demonstrates a method to enlarge the region where a wavefront-corrected beam remains effective through a scattering layer by shifting and scaling the corrected wavefront, achieving larger lateral and axial scanning ranges without extra measurements.
Abstract
Wavefront shaping allows light to be focused through scattering objects. However, the wavefront correction found is only valid in a small region called the isoplanatic patch. Here we present a simple approach to extend this isoplanatic patch by shifting and scaling the corrected wavefront appropriately, demonstrating an 8.6-fold increase in the lateral scanning range and a 1.5-fold increase in the axial range through a scattering layer without the need to perform additional wavefront shaping measurements. Our findings agree well with a simple geometrical model that also allows us to extract the effective position of the scattering layer from the measurements.