Learning Midcircuit Measurement Backaction from Three Repeated Measurements

Abstract

Accurate modeling of midcircuit measurements (MCMs) is essential for dynamic-circuit operations such as syndrome extraction, measurement-based reset, and the separation of state-preparation and measurement error. Unlike terminal measurement, a noisy MCM both produces a classical outcome and alters the incoming quantum state, thereby influencing subsequent circuit operations. This makes conventional confusion-matrix or fidelity-level characterization insufficient. Here, we introduce an efficient, self-consistent protocol for learning a single-qubit Z-twirled MCM instrument, retaining the readout-backaction correlations and excitation-decay asymmetry that are erased in Pauli-error descriptions. Remarkably, readout bit strings from only three repeated MCMs on a maximally mixed input determine all learnable parameters of the reduced instrument, up to a single unidentifiable gauge degree of freedom. Physicality constraints convert this nonidentifiability into narrow, gauge-aware error intervals. Implemented on IBM superconducting processors, the learned instrument improves Pauli-observable prediction by $\sim 100\times$ over a conventional confusion-matrix model and reveals a $T_1$-decay dominated backaction. Our protocol provides a compact characterization layer for state-preparation and measurement error separation, reset optimization, and noise-aware quantum error correction.

arXiv commentAccepted for publication in Physical Review Letters. Incorporates final proof corrections, updated references, and patent disclosure; 44 pages total (6-page Letter and 38-page Supplemental Material), 4 figures total (2 in the Letter and 2 in the Supplemental Material)