A 4D-STEM Tomographic Framework Assisted by Object Tracking for Nanoparticle Structure Determination

Abstract

Three-dimensional electron diffraction (3D ED) has emerged as a powerful method for solving the structures of sub-micron-sized particles down to nanoparticles. However, it faces technical challenges when applied to beam-sensitive samples or agglomerated nanoparticles. This study presents a novel approach that combines 4D-STEM tomography with object tracking and segmentation algorithms to overcome these limitations and achieve single-crystalline 3D ED datasets from nanopowder samples. The method and data quality are assessed on brookite TiO2 nanorods and beam-sensitive CsPbBr3 nanoparticles. To finely sample the reciprocal-space, the data acquisition was automated to acquire hundreds of 4D-STEM scans at fine tilt steps using a slightly convergent beam (0.6 to 1 mrad). Compared to conventional 3D ED methodologies, the proposed method provides enhanced signal-to-noise ratio, low illumination time for reducing beam damage, and the ability to analyze multiple particles from a single tomographic dataset. The procedure is optimized to be feasible using commercially available desktops and detectors. This extends the method applicability to systems and samples that were very challenging for conventional 3D ED methods, by eliminating several technical challenges for the data acquisition.

The main text is 36-pages long with 15 figures. The supporting information is 14-pages long with 7 figures. The article is submitted to Small Methods journal in Wiley. Version 2 includes the changes during the revision