Phase noise measurement of semiconductor optical amplifiers
arXiv:2507.13128 · doi:10.1109/JLT.2025.3627489
Abstract
We introduce a novel measurement method for the phase noise measurement of optical amplifiers, topologically similar to the Heterodyne Mach-Zehnder Interferometer but governed by different principles, and we report on the measurement of a fibered amplifier at 1.55 wavelength. The amplifier under test (DUT) is inserted in one arm of a symmetrical Mach-Zehnder interferometer, with an AOM in the other arm. We measure the phase noise of the RF beat detected at the Mach-Zehnder output. The phase noise floor of the amplifier decreases proportionally to the reciprocal of the laser power at the amplifier input, down to at . The DUT flicker noise cannot be measured because it is lower than the background of the setup. This sets an upper bound of the amplifier noise at at , which corresponds to a frequency stability of (Allan deviation), where is the integration time. Such noise level is lower than that of most Fabry-Perot cavity-stabilized lasers. These results are of interest in a wide range of applications including metrology, instrumentation, optical communications, or fiber links.
7 pages, two-column IEEE format, 5 figures, 52 references
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