Terahertz field effect in a two-dimensional semiconductor MoS2
arXiv:2504.16333 · doi:10.1038/s41467-025-60588-6
Abstract
Layered two-dimensional (2D) materials, with their atomic-scale thickness and tunable electronic, optical, and mechanical properties, open many promising pathways to significantly advance modern electronics. The field effect caused by a strong electric field, typically of MV/cm level, applied perpendicular to the material layers, is a highly effective method for controlling these properties. Field effect allows the regulation of the electron flow in transistor channels, improves the photodetector efficiency and spectral range, and facilitates the exploration of novel exotic quantum phenomena in 2D materials. However, existing approaches to induce the field effect in 2D materials utilize circuit-based electrical gating methods fundamentally limited to microwave response rates. Device-compatible ultrafast, sub-picosecond control needed for modern technology and basic science applications still remains a challenge. In this study, we demonstrate such an ultrafast field effect in atomically thin MoS2, an archetypal 2D semiconductor, embedded in a hybrid 3D-2D terahertz nanoantenna structure. This nanoantenna efficiently converts an incident terahertz electric field into the vertical ultrafast gating field in MoS2 while simultaneously enhancing it to the required MV/cm level. We observe the terahertz field effect optically as coherent terahertz-induced Stark shift of characteristic exciton resonances in MoS2. Our results enable novel developments in technology and the fundamental science of 2D materials, where the terahertz field effect is crucial.
Manuscript 16 pages 5 figures. Supplementary Information 50 pages
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