paper

Doppler-free spectroscopy of the Cs atomic transition at 456 nm in a nanometric-thick vapor layer

arXiv:2501.18266

Abstract

The features of Doppler-free resonances detected by probing the Cs atom transition at 456 nm in a nanometric-thick vapor layer are investigated. The matrix element of this transition is about 11 times smaller than that of the Cs D line (852 nm). When the vapor layer thickness is nm, we observe Dicke narrowing of the lines, accompanied by a red frequency shift of the atomic transitions, which is attributed to atom-surface interactions. Realizing optical pumping with nm in a single-pass configuration, we observe Doppler-free resonances with a linewidth MHz, located at the atomic transitions frequencies with a correspondence of the amplitudes to the transition intensities. These narrow resonances are of interest for high-resolution spectroscopy and instrumentation, and could serve as a frequency reference.