Light-based Chromatic Aberration Correction of Ultrafast Electron Microscopes
arXiv:2501.10210 · doi:10.1103/PhysRevLett.134.203802
Abstract
We propose and theoretically demonstrate a technique that allows one to compensate for chromatic aberrations of traditional electron lenses in ultrafast electron microscopes. The technique is based on space- and time-dependent phase modulation of a pulsed electron beam using interaction with a shaped pulsed ponderomotive lens. The energy-selective focal distance is reached by combining the electron temporal chirp with the time-dependent size of the effective potential, with which the electrons interact. As a result, chromatic aberration can be reduced by up to a factor of seven. This approach paves the way for advanced transverse and longitudinal wavefront shaping of electrons in free space.
v1: AAM; licence: CC BY 4.0
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