Corner cutting connects chiral colorimetry to net electric flux in lossless all-dielectric metasurfaces
arXiv:2411.05984 · doi:10.1364/OE.545515
Abstract
All-dielectric metasurfaces can produce structural colors, but the most advantageous design criteria are still being investigated. This work numerically studies how the two-dimensional shape of nanoparticles affects the colorimetric response under circularly polarized light (CPL) to develop a sensor distinguishing CPL orientations. Using lossless dielectric materials (silicon nitride on silicon dioxide), we achieve far-field dichroism by modifying oblong nanoparticles into L-shaped structures through corner cuts. This design suppresses one electric dipole under CPL illumination, leading to differential colorimetric responses. We link these responses to a decoupling effect in the near-field net electric flux. Our findings provide design guidelines for all-dielectric, lossless colorimetric sensors of chiral light.
This is an unedited version of a work submitted to Optics Express, with 46 pages (15 main text, 31 supplemental document), 28 figures (5 main text, 23 supplemental document), and 8 tables (all supplemental document). Dataset and Code files are with the Optics Express submission