Scaling behavior of the localization length for TE waves at critical incidence on short-range correlated stratified random media
arXiv:2406.08156 · doi:10.1016/j.rinp.2024.107820
Abstract
We theoretically investigate the scaling behavior of the localization length for -polarized electromagnetic waves incident at a critical angle on stratified random media with short-range correlated disorder. By employing the invariant embedding method, extended to waves in correlated random media, and utilizing the Shapiro-Loginov formula of differentiation, we accurately compute the localization length of waves incident obliquely on stratified random media that exhibit short-range correlated dichotomous randomness in the dielectric permittivity. The random component of the permittivity is characterized by the disorder strength parameter and the disorder correlation length . Away from the critical angle, depends on these parameters independently. However, precisely at the critical angle, we discover that for waves with wavenumber , depends on the single parameter , satisfying a universal equation across the entire range of parameter values. Additionally, we find that scales as for the entire range of the wavelength , regardless of the values of and . We demonstrate that under sufficiently strong disorder, the scaling behavior of the localization length for all other incident angles converges to that for the critical incidence.
arXiv comment8 pages, 5 figures
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