Niobium coaxial cavities with internal quality factors exceeding 1.5 billion for circuit quantum electrodynamics

Abstract

Group-V materials such as niobium and tantalum have become popular choices for extending the performance of circuit quantum electrodynamics (cQED) platforms allowing for quantum processors and memories with reduced error rates and more modes. The complex surface chemistry of niobium however makes identifying the main modes of decoherence difficult at millikelvin temperatures and single-photon powers. We use niobium coaxial quarter-wave cavities to study the impact of etch chemistry, prolonged atmospheric exposure, and the significance of cavity conditions prior to and during cooldown, in particular niobium hydride evolution, on single-photon coherence. We demonstrate cavities with quality factors of Q_int>1.4X10^9 in the single-photon regime, a 15 fold improvement over aluminum cavities of the same geometry. We rigorously quantify the sensitivity of our fabrication process to various loss mechanisms and demonstrate a 2-4X reduction in the two-level system (TLS) loss tangent and a 3-5X improvement in the residual resistance over traditional BCP etching techniques. Finally, we demonstrate transmon integration and coherent cavity control while maintaining a cavity coherence of 11.3ms. The accessibility of our method, which can easily be replicated in academic-lab settings, and the demonstration of its performance mark an advancement in 3D cQED.

14 pages, 10 figures v2 edits: -tables in TeX format -Fig 2.C label fixed to Nb2-1 and correctly referenced in text -References added to discussion on wet oxidation and vacancies -Added Nb2O fit to Fig 3B -Deleted duplicate reference -Typo fixes