Standardization of chemically selective atomic force microscopy for metal-oxide surfaces
arXiv:2402.11045 · doi:10.1021/acsnano.4c03155
Abstract
The complex atomic structures and defects of metal-oxide surfaces are vital for a variety of applications in material science and chemistry. While scanning probe microscopy allows accessing atomic-scale structures in real space, elemental discrimination and defect characterization usually rely on indirect assumptions and extensive theoretical modelling. By investigating a variety of different sample systems with increasing structural complexity and inherent defects, we demonstrate that noncontact atomic force microscopy with an O-terminated copper tip allows imaging metal-oxide surfaces with a clear elemental contrast. This universal approach provides not only immediate access to the metal- and oxygen sub-lattices, but also to the chemical and structural configuration of atomic-scale defect structures. The observed contrast can be explained by purely electrostatic interactions between the negatively charged tip apex and the strongly varying electrostatic potential between metal- and oxygen surface sites. These results offer a standardized methodology for the direct structural characterization of even most-complex metal-oxide surfaces, which is highly relevant for a fundamental understanding of atomic-scale processes on these material systems.
arXiv commentTo be published
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