Fast measurement of group index variation with ultimate precision using Hong-Ou-Mandel interferometry

Abstract

Hong-Ou-Mandel (HOM) interferometry has emerged as a valuable tool for quantum sensing applications, particularly in measuring physical parameters that influence the relative optical delay between pair photons. Unlike classical techniques, HOM-based quantum sensors offer higher resolution due to their intrinsic dispersion cancellation property. Despite this advantage, achieving precise measurements of optical delay crucial for practical applications often involves time-consuming integration and post-processing with traditional statistical methods. To address this challenge, our recent work focused on optimizing optical delay measurements in a time-efficient manner. By carefully selecting the length of a 1 mm periodically-poled KTP (PPKTP) crystal for pair photon generation, we achieved a remarkable group index measurement precision of $\sim 6.75\times 10^{-6}$ per centimeter of sample length, surpassing the previous maximum precision by over 400$\%$. These current measurements maintain fast detection and high photon counts, which are essential for practical quantum sensing applications. The HOM-based method, while limiting the measurement range, can be extended by compensating for photon delay using an optical delay stage. As a proof-of-principle, we measured the group index variation of PPKTP over a temperature range up to 200${}^{\circ }$C with a precision in the range of one part per million ($\sim$10${}^{-6}$). This advancement not only contributes to quantum sensing but also holds promising implications for high-precision and long-range measurements in quantum optical coherence tomography.

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