Fourier Quantum Process Tomography
arXiv:2312.13458 · doi:10.1038/s41534-024-00844-7
Abstract
The characterization of a quantum device is a crucial step in the development of quantum experiments. This is accomplished via Quantum Process Tomography, which combines the outcomes of different projective measurements to deliver a possible reconstruction of the underlying process. The tomography is typically performed by processing an overcomplete set of measurements and extracting the process matrix from maximum-likelihood estimation. Here, we introduce a new technique, referred to as Fourier Quantum Process Tomography, which requires a reduced number of measurements, and benchmark its performance against the standard maximum-likelihood approach. Fourier Quantum Process Tomography is based on measuring probability distributions in two conjugate spaces for different state preparations and projections. Exploiting the concept of phase retrieval, our scheme achieves a complete and robust characterization of the setup by processing a near-minimal set of measurements. We experimentally test the technique on different space-dependent polarization transformations, reporting average fidelities higher than 90% and significant computational advantage.
References in corpus (10)
- Integrated Photonic Quantum Technologies
- Shor's quantum factoring algorithm on a photonic chip
- Process tomography of ion trap quantum gates
- Complete Characterization of Quantum-Optical Processes
- Holographic generation of highly twisted electron beams
- Experimental quantum process tomography of non trace-preserving maps
- Operator fidelity susceptibility: an indicator of quantum criticality
- Quantum Fourier Transform using Dynamic Circuits
- Geometrically-controlled polarisation processing in an integrated photonic platform
- Real-time phase-retrieval and wavefront sensing enabled by an artificial neural network