Observation of the Quantum Zeno Effect on a NISQ Device

Abstract

We study the Quantum Zeno Effect (QZE) on a single qubit on IBM Quantum Experience devices under the effect of multiple measurements. We consider two possible cases: the Rabi evolution and the free decay. SPAM error mitigations have also been applied. In both cases we observe the occurrence of the QZE as an increasing of the survival probability with the number of measurements.

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