Effective electrical conductivity of random resistor networks generated using a Poisson--Voronoi tessellation

Abstract

We studied the effective electrical conductivity of dense random resistor networks (RRNs) produced using a Voronoi tessellation when its seeds are generated by means of a homogeneous Poisson point process in the two-dimensional Euclidean space. Such RRNs are isotropic and in average homogeneous, however, local fluctuations of the number of edges per unit area are inevitably. These RRNs may mimic, e.g., crack-template-based transparent conductive films. The RRNs were treated within a mean-field approach (MFA). We found an analytical dependency of the effective electrical conductivity on the number of conductive edges (resistors) per unit area, $n_{\text{E}}$. The effective electrical conductivity is proportional to $\sqrt{n_{\text{E}}}$ when $n_{\text{E}}\gg 1$.

4 pages, 2 figures, 17 references, Applied Physics Letters (accepted)

References in corpus (1)

• Geometric model of crack-templated networks for transparent conductive films

Cited by in corpus (4)

• Effective medium theory for the electrical conductivity of random metallic nanowire networks
• Phenomenological model of crack patterns in thin colloidal films undergoing desiccation
• Electrical conductivity of randomly placed linear wires: a mean field approach
• Electrical conductivity of conductive films based on random metallic nanowire networks