Dual-recycled interference-based weak value metrology

Abstract

Weak-value-amplification permits small effects to be measured as observable changes at the sacrifice of power due to post-selection. The power recycling scheme has been proven to eliminate this inefficiency of the rare post-selection, thus surpassing the limit of the shot noise and improving the precision of the measurement. However, the improvement is strictly limited by the system setup, especially the system loss. Here we introduce a dual recycling model based on the interferometric weak-value-based deflection measurement. Two mirrors, the power-recycling mirror and signal-recycling mirror, are placed at the bright and dark port of the interferometer respectively, creating a composite resonator. The results show that both the power and the signal-to-noise ratio (SNR) are greatly enhanced in a wider range of experimental parameters compared to the power-recycling scheme. This work considerably loosens the constraint of the system setup and further explores the real advantage of weak measurement over traditional schemes.

7 pages, 5 figures, reference

References in corpus (5)

• Ultrasensitive Beam Deflection Measurement via Interferometric Weak Value Amplification
• Experimental joint weak measurement on a photon pair as a probe of Hardy's Paradox
• Measuring ultrasmall time delays of light by joint weak measurements
• Power-recycled weak-value-based metrology
• Weak measurement og the composite Goo-Haenchen shift in the critical region