Field-Emission Resonances in Thin Metallic Films: Nonexponential Decay of the Tunneling Current as a Function of the Sample-to-Tip Distance
arXiv:2308.00418 · doi:10.1021/acs.jpcc.2c02374
Abstract
Field-emission resonances (FERs) for two-dimensional Pb(111) islands grown on \mbox{Si(111)77} surfaces were studied by low-temperature scanning tunneling microscopy and spectroscopy (STM/STS) in a broad range of tunneling conditions with both active and disabled feedback loop. These FERs exist at quantized sample-to-tip distances above the sample surface, where is the serial number of the FER state. By recording the trajectory of the STM tip during ramping of the bias voltage (while keeping the tunneling current fixed), we obtain the set of the values corresponding to local maxima in the derived spectra. This way, the continuous evolution of as a function of for all FERs was investigated by STS experiments with active feedback loop for different . Complementing these measurements by current-distance spectroscopy at a fixed , we could construct a 4-dimensional diagram, that allows us to investigate the geometric localization of the FERs above the surface. We demonstrate that (i) the difference between neighboring FER lines in the diagram is independent of for higher resonances, (ii) the value decreases as increases; (iii) the quantized FER states lead to the \emph{periodic} variations of as a function of with periodicity ; (iv) the periodic variations in the spectra allows to estimate the absolute height of the tip above the sample surface. Our findings contribute to a deeper understanding on how the FER states affect various types of tunneling spectroscopy experiments and how they lead to a non-exponential decay of the tunneling current as a function of at high bias voltages in the regime of quantized electron emission.
25 pages, 18 figures
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