paper

Nanoscale domain engineering in SrRuO thin films

arXiv:2307.12651

Abstract

We investigate nanoscale domain engineering via epitaxial coupling in a set of SrRuO/PbTiO/SrRuO heterostructures epitaxially grown on (110)-oriented DyScO substrates. The SrRuO layer thickness is kept at 55 unit cells, whereas the PbTiO layer is grown to thicknesses of 23, 45 and 90 unit cells. Through a combination of atomic force microscopy, x-ray diffraction and high resolution scanning transmission electron microscopy studies, we find that above a certain critical thickness of the ferroelectric layer, the large structural distortions associated with the ferroelastic domains propagate through the top SrRuO layer, locally modifying the orientation of the orthorhombic SrRuO and creating a modulated structure that extends beyond the ferroelectric layer boundaries.

19 pages, 6 figures, supplementary materials. arXiv admin note: text overlap with arXiv:2304.06948