Prospects of violation in decay with polarized electron beam at STCF
arXiv:2306.15602 · doi:10.1088/1674-1137/ace9c5
Abstract
Based on Monte Carlo (MC) events produced from a longitudinally-polarized electron beam, the sensitivity of violation of decay is studied with fast simulation software. In addition, the decay can also be used as a process to optimize the detector response using the interface provided by the fast simulation software. In the future, STCF is expected to obtain 3.4 trillion events, and the statistical sensitivity of violation of decay via process is expected to reach ~ when the electron beam polarization is 80\%.
References in corpus (5)
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- Study of CP violation in hyperon decays at Super Charm-Tau Factories with a polarized electron beam
- Direct CP violation in beauty and charm hadron decays
- A fast simulation package for STCF detector