Epitaxial growth and electronic structure of Ruddlesden-Popper nickelates ()
arXiv:2305.10271 · doi:10.1063/5.0018934
Abstract
We report the epitaxial growth of Ruddlesden-Popper nickelates, , with up to 5 by reactive molecular beam epitaxy (MBE). X-ray diffractions indicate high crystalline quality of these films and transport measurements show strong dependence on the values. Angle-resolved photoemission spectroscopy (ARPES) reveals the electronic structure of , showing a large hole-like pocket centered around the Brillouin zone corner with a back-folded copy.
11 pages, 4 figures
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Cited by in corpus (5)
- Electronic structure and magnetic properties of higher-order layered nickelates: LaNiO ()
- Synthesis and electronic properties of NdNiO Ruddlesden-Popper nickelate thin films
- Limits to the strain engineering of layered square-planar nickelate thin films
- Electronic structure of higher-order Ruddlesden-Popper nickelates
- Emergent flat-band physics in multilayer nickelates