Directional dark-field retrieval with single-grid x-ray imaging

Abstract

Directional dark-field imaging is an emerging x-ray modality that is sensitive to unresolved anisotropic scattering from sub-pixel sample microstructures. A single-grid imaging set-up can be used to capture dark-field images by looking at changes in a grid pattern projected upon the sample. By creating analytical models for the experiment, we have developed a single-grid directional dark field retrieval algorithm that can extract dark-field parameters such as the dominant scattering direction, and the semi-major and -minor scattering angles. We show that this method is effective even in the presence of high image noise, allowing for low dose and time sequence imaging.

References in corpus (1)

• Quantifying the x-ray dark-field signal in single-grid imaging

Cited by in corpus (3)

• Single-exposure x-ray dark-field imaging: quantifying sample microstructure using a single-grid setup
• X-ray dark-field via spectral propagation-based imaging
• Near-perfect efficiency in X-ray phase microtomography