Electronically phase separated nano-network in antiferromagnetic insulating LaMnO3/PrMnO3/CaMnO3 tricolor superlattice
arXiv:2211.02226 · doi:10.1038/s41467-022-34377-4
Abstract
Strongly correlated materials often exhibit an electronic phase separation (EPS) phenomena whose domain pattern is random in nature. The ability to control the spatial arrangement of the electronic phases at microscopic scales is highly desirable for tailoring their macroscopic properties and/or designing novel electronic devices. Here we report the formation of EPS nanoscale network in a mono-atomically stacked LaMnO3/CaMnO3/PrMnO3 superlattice grown on SrTiO3 (STO) (001) substrate, which is known to have an antiferromagnetic (AFM) insulating ground state. The EPS nano-network is a consequence of an internal strain relaxation triggered by the structural domain formation of the underlying STO substrate at low temperatures. The same nanoscale network pattern can be reproduced upon temperature cycling allowing us to employ different local imaging techniques to directly compare the magnetic and transport state of a single EPS domain. Our results confirm the one-to-one correspondence between ferromagnetic (AFM) to metallic (insulating) state in manganite. It also represents a significant step in a paradigm shift from passively characterizing EPS in strongly correlated systems to actively engaging in its manipulation.
References in corpus (9)
- Restoring the density-gradient expansion for exchange in solids and surfaces
- Generalized gradient approximation for solids and their surfaces
- Band Structure Engineering of 2D Materials using Patterned Dielectric Superlattices
- Microwave imaging of mesoscopic percolating network in a manganite thin film
- Anisotropic band flattening in graphene with 1D superlattices
- Multi-messenger nano-probes of hidden magnetism in a strained manganite
- Moiré Engineering of Electronic Phenomena in Correlated Oxides
- Direct Imaging of Sketched Conductive Nanostructures at the LaAlO3/SrTiO3 Interface
- Direct visualization of percolating metal-insulator transition in V2O3 using scanning microwave impedance microscopy