A sample-position-autocorrection system with precision better than 1 \um~in angle-resolved photoemission experiments

Abstract

We present the development of a high-precision sample-position-autocorrection system for photoemission experiments. A binocular vision method based on image pattern matching calculations was realized to track the sample position with an accuracy better than 1 \um, which was much smaller than the spot size of the incident laser. We illustrate the performance of the sample-position-autocorrection system with representative photoemission data on the topological insulator Bi${}_2$Se${}_3$ and an optimally-doped cuprate superconductor \Bi. Our method provides new possibilities for studying the temperature-dependent electronic structures in quantum materials by laser-based or spatially resolved photoemission systems with high precision and efficiency.

6 pages, 4 figures

References in corpus (7)

• 2D materials and van der Waals heterostructures
• Point nodes persisting far beyond Tc in Bi2212
• Light-Tunable Surface State and Hybridization Gap in Magnetic Topological Insulator MnBi${}_8$Te${}_{13}$
• Buried double CuO chains in YBa${}_2$Cu${}_4$O${}_8$ uncovered by nano-ARPES
• A time- and angle-resolved photoemission spectroscopy with probe photon energy up to 6.7 eV
• Dual character of the electronic structure in YBa2Cu4O8: conduction bands of CuO2 planes and CuO chains
• Unusual band splitting and superconducting gap evolution with sulfur substitution in FeSe