Propagating charge carrier plasmon in Sr2RuO4

Abstract

We report on studies of charge carrier plasmon excitations in Sr2RuO4 by transmission Electron Energy-Loss Spectroscopy. In particular, we present results on the plasmon dispersion and its width as a function of momentum transfer. The dispersion can be qualitatively explained in the framework of RPA calculations, using an unrenormalized tight-binding band structure. The constant long-wavelength width of the plasmon indicates, that it is caused by a decay into inter-band transition and not by quantum critical fluctuations. The results from these studies on a prototypical bad metal system show that the long-wavelength plasmon excitations near 1 eV are caused by resilient quasiparticles and are not influenced by correlation effects.

6 pages, 3 figures

References in corpus (5)

• How bad metals turn good: spectroscopic signatures of resilient quasiparticles
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• Electron Energy-Loss Spectroscopy: A versatile tool for the investigations of plasmonic excitations
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Cited by in corpus (2)

• Impact of electron correlations on two-particle charge response in electron- and hole-doped cuprates
• Optical and acoustic plasmons in the layered material Sr${}_2$RuO${}_4$