Polarization analysis of terahertz emission from Bi-2212 cross-whisker intrinsic Josephson junction and its refractive index
arXiv:2209.08506 · doi:10.1063/5.0123290
Abstract
Polarization analyses of the terahertz (THz) emission from BiSrCaCuO whisker crystals used for superconducting THz emitters were conducted. The THz emission mode was estimated by a simple polarization measurement, and a simulation study was conducted to examine the validity of the polarization analysis. The refractive index of whisker crystals revealed through the polarization analyses was greater than that of bulk single crystals and agreed well with our previous THz emission report. The simulation study suggested the complex plasma excitation mode of the THz emission, and an interpretation of the refractive index obtained in this study is provided.
arXiv commentSubmitted to Applied Physics Letters (Accepted: 24 Oct 2022)
References in corpus (8)
- Coherent THz emission of Bi_2Sr_2CaCu_2O_8 intrinsic Josephson junction stacks in the hot spot regime
- Abrupt Change of Josephson Plasma Frequency at the Phase Boundary of the Bragg Glass in Bi_2Sr_2CaCu_2O_{8+δ}
- d-like Symmetry of the Order Parameter and Intrinsic Josephson Effects in Bi2212 Cross-Whisker Junctions
- Superconducting THz sources with 12% power efficiency
- Monolithic superconducting emitter of tunable circularly polarized terahertz radiation
- Mutually synchronized macroscopic Josephson oscillations demonstrated by polarization analysis of superconducting terahertz emitters
- A Cross-Whiskers Junction as a Novel Fabrication Process for Intrinsic Josephson Junction
- THz emission from a Bi2Sr2CaCu2O8+δ cross-whisker junction