Optical Rectification and Electro-Optic Sampling in Quartz
arXiv:2209.01153 · doi:10.1364/OE.480339
Abstract
We report electro-optic sampling (EOS) response and terahertz (THz) optical rectification (OR) in z-cut alpha-quartz. Due to its small effective second-order nonlinearity, echo-free waveform of intense THz pulses with a few MV/cm electric-field strength can be measured faithfully with no saturation effect. Both its OR and EOS responses are broad with extension up to ~8 THz. Strikingly, the latter responses are independent of the crystal thickness, a plausible indication of strong surface contribution to the total second-order nonlinear susceptibility of quartz. Our study introduces thin quartz plates as the reliable THz electro-optic medium for echo-free, high field THz detection.
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