Epitaxial growth of high quality $M{n}_{3}Sn$ thin films by pulsed laser deposition

Abstract

Non-collinear antiferromagnet Weyl semimetal $M{n}_{3}Sn$ have attracted great research interest recently. Although large anomalous Hall effect, anomalous Nernst effect and magneto-optical effect have been observed in $M{n}_{3}Sn$, most studies are based on single crystals. So far, it is still challenging to grow high quality epitaxial $M{n}_{3}Sn$ thin films with transport and optical properties comparable to their single crystal counterparts. Here, we report the structure, magneto-optical and transport properties of epitaxial $M{n}_{3}Sn$ thin films fabricated by pulsed laser deposition (PLD). Highly oriented $M{n}_{3+x}S{n}_{1-x}$ (0001) and (11$\bar{2}$0) epitaxial films are successfully growth on single crystalline $A{l}_2{O}_3$ and MgO substrates. Large anomalous Hall effect (AHE) up to $\left|\Delta R_H\right|$=3.02 $\mu \Omega \cdot cm$, and longitudinal magneto-optical Kerr effect (LMOKE) with ${\theta }_K$ = 38.1 mdeg at 633 nm wavelength are measured at 300 K temperature, which are comparable to $M{n}_{3}Sn$ single crystals. Our work demonstrates that high quality $M{n}_{3}Sn$ epitaxial thin films can be fabricated by PLD, paving the way for future device applications.

References in corpus (8)

• Non-collinear Antiferromagnets and the Anomalous Hall Effect
• Anomalous transport due to Weyl fermions in the chiral antiferromagnets Mn${}_3$$X$, $X$ = Sn, Ge
• Sub-Wavelength Passive Optical Isolators Using Photonic Structures Based on Weyl Semimetals
• Kondo physics in antiferromagnetic Weyl semimetal Mn3+xSn1-x films
• Giant effective damping of octupole oscillation in an antiferromagnetic Weyl semimetal
• Observation of spontaneous x-ray magnetic circular dichroism in a chiral antiferromagnet
• Pressure controlled trimerization for switching of anomalous Hall effect in triangular antiferromagnet Mn${}_3$Sn
• Magneto-optical Kerr effect and signature of the chiral anomaly in a Weyl semimetal in a magnetic field

Cited by in corpus (1)

• Reliable Magnetometry for Antiferromagnets and Thin Films: Correcting Substrate Artifacts in Mn3Sn/MgO Systems