High-precision mass measurement of Si and a refined determination of the process at the waiting point
arXiv:2207.05818 · doi:10.1103/PhysRevC.106.L012801
Abstract
We report a high precision mass measurement of , performed with the LEBIT facility at the National Superconducting Cyclotron Laboratory. The atomic mass excess, (37) keV, is a factor of 5 more precise than previous results. This substantially reduces the uncertainty of the reaction rate, which is a key part of the rapid proton capture () process powering Type I X-ray bursts. The updated rate constrains the onset temperature of the process at the waiting-point to a precision of 9%.
6 pages, 3 figures
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