Measurement induced entanglement transition in two dimensional shallow circuit

Abstract

We prepare two dimensional states generated by shallow circuits composed of (1) one layer of two-qubit CZ gate or (2) a few layers of two-qubit random Clifford gate. After measuring all of the bulk qubits, we study the entanglement structure of the remaining qubits on the one dimensional boundary. In the first model, we observe that the competition between the bulk X and Z measurements can lead to an entanglement phase transition between an entangled volume law phase and a disentangled area law phase. We numerically evaluate the critical exponents and generalize this idea to other qudit systems with local Hilbert space dimension larger than 2. In the second model, we observe the entanglement transition by varying the density of the two-qubit gate in each layer. We give an interpretation of this transition in terms of random bond Ising model in a similar shallow circuit composed of random Haar gates.

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