Holographic convergent electron beam diffraction (CBED) imaging of two-dimensional crystals
arXiv:2201.09265 · doi:10.1142/S0218625X21400011
Abstract
Convergent beam electron diffraction (CBED) performed on two-dimensional (2D) materials recently emerged as a powerful tool to study structural and stacking defects, adsorbates, atomic 3D displacements in the layers, and the interlayer distances. The formation of the interference patterns in individual CBED spots of 2D crystals can be considered as a hologram, thus the CBED patterns can be directly reconstructed by conventional reconstruction methods adapted from holography. In this study, we review recent results applying CBED to 2D crystals and their heterostructures: holographic CBED on bilayers with the reconstruction of defects and the determination of interlayer distance, CBED on 2D crystal monolayers to reveal adsorbates, and CBED on multilayered van der Waals systems with moiré patterns for local structural determination.
References in corpus (9)
- Cross-sectional imaging of individual layers and buried interfaces of graphene-based heterostructures and superlattices
- On the roughness of single- and bi-layer graphene membranes
- Electronic Properties of Graphene Encapsulated with Different Two-Dimensional Atomic Crystals
- Practical algorithms for simulation and reconstruction of digital in-line holograms
- Moire structures in twisted bilayer graphene studied by transmission electron microscopy
- Convergent beam electron holography for analysis of van der Waals heterostructures
- Three-dimensional surface topography of graphene by divergent beam electron diffraction
- Convergent and divergent beam electron holography and reconstruction of adsorbates on free-standing two-dimensional crystals
- Convergent beam electron diffraction of multilayer van der Waals structures