Quantum jump metrology in a two-cavity network
arXiv:2201.04412 · doi:10.1103/PhysRevA.106.062619
Abstract
Quantum metrology enhances measurement precision by utilising the properties of quantum physics. In interferometry, this is typically achieved by evolving highly-entangled quantum states before performing single-shot measurements to reveal information about an unknown parameter. While this is often the optimum approach, implementation with all but the smallest states is still extremely challenging. An alternative approach is quantum jump metrology [L. A. Clark et al., Phys. Rev. A 99, 022102 (2019)] which deduces information by continuously monitoring an open quantum system, while inducing phase-dependent temporal correlations with the help of quantum feedback. Taking this approach here, we analyse measurements of a relative phase in an optical network of two cavities with quantum feedback in the form of laser pulses. It is shown that the proposed approach can exceed the standard quantum limit without the need for complex quantum states while being scalable and more practical than previous related schemes.
13 pages, 6 figures, substantially revised version, final accepted version
References in corpus (8)
- Quantum Optical Metrology -- The Lowdown on High-N00N States
- Beating the Standard Quantum Limit with Four Entangled Photons
- Entanglement-free Heisenberg-limited phase estimation
- Entanglement-enhanced measurement of a completely unknown phase
- Quantum Metrology: Dynamics vs. Entanglement
- Quantum-limited metrology with product states
- Bayesian parameter inference from continuously monitored quantum systems
- Exploiting non-linear effects in optomechanical sensors with continuous photon-counting