Influence of device non-uniformities on the accuracy of Coulomb blockade thermometry
arXiv:2112.13830 · doi:10.1088/1681-7575/ac79e8
Abstract
We investigate temperature errors of Coulomb blockade thermometer (CBT) arising from inevitable non-uniformities in tunnel junction arrays. The errors are proportional to the junction resistance variance in the universal operation regime and this result holds approximately also beyond this originally studied high temperature range. We present both analytical and numerical results, and discuss briefly their implications on achievable uniformity based on state-of-the-art fabrication of sensors.
References in corpus (9)
- Nanoelectronic thermometers optimised for sub-10 millikelvin operation
- Progress in cooling nanoelectronic devices to ultra-low temperatures
- 500 microkelvin nanoelectronics
- On-and-off chip cooling of a Coulomb blockade thermometer down to 2.8 mK
- On-chip magnetic cooling of a nanoelectronic device
- Accurate Coulomb Blockade Thermometry up to 60 Kelvin
- Traceable Coulomb Blockade Thermometry
- Primary tunnel junction thermometry
- Coulomb blockade thermometry beyond the universal regime