Delayed onset and directionality of x-ray-induced atomic displacements observed on subatomic length scales

Abstract

Transient structural changes of Al${}_2$O${}_3$ on subatomic length scales following irradiation with an intense x-ray laser pulse (photon energy: 8.70 keV; pulse duration: 6 fs; fluence: 8$\times$10${}^2$ J/cm${}^2$) have been investigated by using an x-ray pump x-ray probe technique. The measurement reveals that aluminum and oxygen atoms remain in their original positions by $\sim$20 fs after the intensity maximum of the pump pulse, followed by directional atomic displacements at the fixed unit cell parameters. By comparing the experimental results and theoretical simulations, we interpret that electron excitation and relaxation triggered by the pump pulse modifies the potential energy surface and drives the directional atomic displacements. Our results indicate that high-resolution x-ray structural analysis with the accuracy of 0.01 Åis feasible even with intense x-ray pulses by making the pulse duration shorter than the timescale needed to complete electron excitation and relaxation processes, which usually take up to a few tens of femtoseconds.

References in corpus (1)

• Thermal and nonthermal melting of silicon under femtosecond x-ray irradiation

Cited by in corpus (5)

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• Ultrafast demagnetization in bulk nickel induced by X-ray photons tuned to Ni $M_3$ and $L_3$ absorption edges
• Electronic mechanism of sub-100-fs demagnetization induced by a femtosecond light pulse