Accurate determination of the Josephson critical current by lock-in measurements
arXiv:2112.04320 · doi:10.3390/nano11082058
Abstract
Operation of Josephson electronics usually requires determination of the Josephson critical current , which is affected both by fluctuations and measurement noise. Lock-in measurements allow obviation of noise and, therefore, provide a major advantage in terms of noise and accuracy with respect to conventional dc-measurements. In this work we show both theoretically and experimentally that the can be accurately extracted using first and third harmonic lock-in measurements of junction resistance. We derive analytic expressions and verify them experimentally on nano-scale Nb-PtNi-Nb and Nb-CuNi-Nb Josephson junctions.
arXiv comment5 pages, 3 figures
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