Molecular Beam Epitaxy growth of MoTe on Hexagonal Boron Nitride
arXiv:2111.12433 · doi:10.1016/j.jcrysgro.2022.126806
Abstract
Hexagonal boron nitride has already been proven to serve as a decent substrate for high quality epitaxial growth of several 2D materials, such as graphene, MoSe, MoS or WSe. Here, we present for the first time the molecular beam epitaxy growth of MoTe on atomically smooth hexagonal boron nitride (hBN) substrate. Occurrence of MoTe in various crystalline phases such as distorted octahedral 1T' phase with semimetal properties or hexagonal 2H phase with semiconducting properties opens a possibility of realisation of crystal-phase homostructures with tunable properties. Atomic force microscopy studies of MoTe grown in a single monolayer regime enable us to determine surface morphology as a function of the growth conditions. The diffusion constant of MoTe grown on hBN can be altered 5 times by annealing after the growth, reaching about 5 10 cm/s. Raman spectroscopy results suggest a coexistence of both 2H and 1T' MoTe phases in the studied samples.
8 pages, 4 figures
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Cited by in corpus (3)
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