Atomic force microscopy calibration of standing surface acoustic wave amplitudes

Abstract

Atomic force microscopy is an important tool for characterizing surface acoustic waves, in particular for high frequencies, where the wavelength is too short to be resolved by laser interferometry. A caveat is, that the cantilever deflection is not equal to the amplitude of the surface acoustic wave. We show, that the energy transfer from the moving surface to the cantilever instead leads to a deflection exceeding the surface modulation. We present a method for an accurate calibration of surface acoustic wave amplitudes based on comparing force-curve measurements with the equation of motion of a driven cantilever. We demonstrate our method for a standing surface acoustic wave on a GaAs crystal confined in a focusing cavity with a resonance frequency near 3 GHz.

9 pages, 11 figures

Cited by in corpus (5)

• Nanoscale Imaging of Super-High-Frequency Microelectromechanical Resonators with Femtometer Sensitivity
• High-resolution acoustic field mapping of GHz phononic crystals with atomic force microscopy
• Scanning X-ray diffraction microscopy of a 6 GHz surface acoustic wave
• Gigahertz modulation of a fully dielectric nonlocal metasurface
• Imaging GHz surface acoustic wave modes in electrostricted LaAlO${}_3$/SrTiO${}_3$ heterostructures