Characterizing random 1D media with an embedded reflector via scattered waves

Abstract

We show in random matrix theory, microwave measurements, and computer simulations that the mean free path of a random medium and the strength and position of an embedded reflector can be determined from radiation scattered by the system. The mean free path and strength of the reflector are determined from the statistics of transmission. The statistics of transmission are independent of the position of the reflector. The reflector's position can be found, however, from the average dwell time for waves incident from one side of the sample.

6 pages, 5 figures. Minor changes compared to v1

References in corpus (2)

• Controlling conductance statistics of quantum wires by driving ac fields
• Invariance principle for wave propagation inside inhomogeneously disordered materials