MAST-SEY: MAterial Simulation Toolkit for Secondary Electron Yield. A monte carlo approach to secondary electron emission based on complex dielectric functions
arXiv:2108.11582 · doi:10.1016/j.commatsci.2021.110281
Abstract
MAST-SEY is an open-source Monte Carlo code capable of calculating secondary electron emission using input data generated entirely from first principle (density functional theory) calculations. It utilizes the complex dielectric function and Penn's theory for inelastic scattering processes, and relativistic Schrödinger theory by means of a partial-wave expansion method to govern elastic scattering. It allows the user to include explicitly calculated momentum dependence of the dielectric function, as well as to utilize first-principle density of states in secondary electron generation, which provides a more complete description of the underlying physics. In this paper we thoroughly describe the theoretical aspects of the modeling, as used in the code, and present sample results obtained for copper and aluminum.
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