Simulation of Scanning Near-Field Optical Microscopy Spectra of 1D Plasmonic Graphene Junctions

Abstract

We present numerical simulations of scattering-type Scanning Near-Field Optical Microscopy (s-SNOM) of 1D plasmonic graphene junctions. A comprehensive analysis of simulated s-SNOM spectra is performed for three types of junctions. We find conditions when the conventional interpretation of the plasmon reflection coefficients from s-SNOM measurements does not apply. Our results are applicable to other conducting 2D materials and provide a comprehensive understanding of the s-SNOM techniques for probing local transport properties of 2D materials.

15 pages, 6 figures

References in corpus (5)

• Two-Dimensional Material Nanophotonics
• Dyadic Green's Functions and Guided Surface Waves for a Surface Conductivity Model of Graphene
• Anomalous Reflection Phase of Graphene Plasmons and its Influence on Resonators
• Hybrid Machine Learning for Scanning Near-field Optical Spectroscopy
• Scattering of graphene plasmons at abrupt interfaces: an analytic and numeric study

Cited by in corpus (1)

• Gradient polaritonic surface with space-variant switchable light-matter interactions in 2D moire superlattices