Susceptibility of Trapped-Ion Qubits to Low-Dose Radiation Sources

Abstract

We experimentally study the real-time susceptibility of trapped-ion quantum systems to small doses of ionizing radiation. We expose an ion-trap apparatus to a variety of $\alpha$, $\beta$, and $\gamma$ sources and measure the resulting changes in trapped-ion qubit lifetimes, coherence times, gate fidelities, and motional heating rates. We found no quantifiable degradation of ion trap performance in the presence of low-dose radiation sources for any of the measurements performed. This finding is encouraging for the long-term prospects of using ion-based quantum information systems in extreme environments, indicating that much larger doses may be required to induce errors in trapped-ion quantum processors.

10 pages, 3 figures, 1 table, slightly revised text

References in corpus (5)

• Fault-tolerant quantum computation with high threshold in two dimensions
• Experimental Comparison of Two Quantum Computing Architectures
• Manipulation and Detection of a Trapped Yb+ Ion Hyperfine Qubit
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• Susceptibility of Trapped-Ion Qubits to Low-Dose Radiation Sources

Cited by in corpus (1)

• Susceptibility of Trapped-Ion Qubits to Low-Dose Radiation Sources